Search
Basket
0 items
No products in the basket.
Home
What We Do
About Us
Products
Products
Flexible Coils
Rigid Coils
Integrators
Transducers
Theory
Theory
Applications
Articles and Papers
Operating Principle
Operating Limits
Calibration & Testing
FAQs
Get in touch
Search
MENU
Translate
English
Afrikaans
Albanian
Amharic
Arabic
Armenian
Azerbaijani
Basque
Belarusian
Bengali
Bosnian
Bulgarian
Catalan
Cebuano
Chichewa
Chinese (Simplified)
Chinese (Traditional)
Corsican
Croatian
Czech
Danish
Dutch
Esperanto
Estonian
Filipino
Finnish
French
Frisian
Galician
Georgian
German
Greek
Gujarati
Haitian Creole
Hausa
Hawaiian
Hebrew
Hindi
Hmong
Hungarian
Icelandic
Igbo
Indonesian
Irish
Italian
Japanese
Javanese
Kannada
Kazakh
Khmer
Korean
Kurdish (Kurmanji)
Kyrgyz
Lao
Latin
Latvian
Lithuanian
Luxembourgish
Macedonian
Malagasy
Malay
Malayalam
Maltese
Maori
Marathi
Mongolian
Myanmar (Burmese)
Nepali
Norwegian
Pashto
Persian
Polish
Portuguese
Punjabi
Romanian
Russian
Samoan
Scots Gaelic
Serbian
Sesotho
Shona
Sindhi
Sinhala
Slovak
Slovenian
Somali
Spanish
Sundanese
Swahili
Swedish
Tajik
Tamil
Telugu
Thai
Turkish
Ukrainian
Urdu
Uzbek
Vietnamese
Welsh
Xhosa
Yiddish
Yoruba
Zulu
What We Do
About Us
Products
Flexible Coils
1000 Series Flexible Rogowski Coils
4000 Series Rogowski Coils
Tube Coils
Rigid Coils
2100 Series Rigid Rogowski Coils
Printed Circuit Board Coils
Integrators
Rocoil ‘DIN-Rail’ Rogowski Coil Integrator with 4 – 20mA Output
Rocoil ‘DIN-AC’ Rogowski Coil Integrator
Rocoil ‘Wall-Mounted’ Rogowski Coil Current Measuring System
Rocoil ‘Wall-Mounted’ Rogowski Coil Current Measuring System With 1A Output Current Drivers
OEM Integrators
6141 Rogowski Coil Integrator
7000 Series Rogowski Coil Integrators
8000 Series Rogowski Coil Integrators
Rocoil 8141RM Integrator
Passive Integrator
Transducers
Rail Current Transducer
8000 Series Rogowski Coil Integrators
Theory
Applications
Articles and Papers
Operating Principle
Operating Limits
Calibration & Testing
FAQs
Get in touch
Search
Petroleum - Rocoil Ltd
Measuring both leakage and fault currents in a semi-conductor device